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DDR/Memory
Continual demand for memories to be larger, faster, lower powered and physically smaller is driving the advancement of SDRAM technology.
Tektronix' powerful and comprehensive test instrument portfolio for SDRAMs, memory controllers, DIMMs, computer motherboards and embedded systems will help you resolve design challenges quickly and efficiently.
- Digital Validation and Debug Fact Sheet
- Electrical Validation and Debug Fact Sheet
- Signal Path Characterization Fact Sheet
DDR: Digital Validation and Debug
| Product | Description | DDR/DDR2 - DIMM | DDR2 - Embedded | DDR3 - DIMM | DDR3 - Embedded |
| Logic Analyzer Mainframe | TLA7012 Portable or TLA7016 Benchtop TLA6000 with Opt DDR2x8 or DDR2x16 |
1 | 1 | 1 | 1 |
| Logic Analyzer Module | TLA7BB4 Module | 1 or more | 1 or more | 1 or more | |
| Analysis Package | Nexus Technology NEXVu DDR Support or FuturePlus Systems DDR3 Support | Included with probe | Included with TLA6000 DDR2 option | Included with probe | Included with probe |
| Probing | Different options are available: Tektronix midbus probes, Nexus Technology interposers, instrumented DIMMs, and BGA chip interposers, or FuturePlus interposers. |
DDR: Electrical Validation and Debug
| Product | Description | Quantity |
| Oscilloscope | MSO/DPO5000 Series with DDRA, DJA | 1 |
| DPO/DSA/MSO70000 Series with options DDRA, ASM, DJA | 1 | |
| Accessories | Nexus Technology x4/x8/x16 solder or socket BGA chip interposers for oscilloscope probes | 1 |
| Active Differential Probe | P7300 or P7500 Series Differential Probes | 2 or more |
DDR: Signal Path Characterization
| Product | Description | Quantity |
| Sampling Oscilloscope | DSA8300 Sampling Oscilloscope | 1 |
| Modules | 80E04 or 80E10 TDR Sampling Module | 1 |
| Analysis Software | 80SSPAR IConnect S-parameter Software | 1 |
| Product Series | |
|---|---|
Electrical Verification of DDR MemoryWith the ever increasing DDR SDRAM Clock Frequencies and Signal Edge Rates, signal integrity and bus state verification techniques are increasingly important for DDR Memory design success. This application note focuses on techniques for triggering and decode of the command bus and isolating read/write signals, as well as on a variety of memory signal integrity measurements. |
DPO/DSA/MSO70000 |
High-speed Interconnects: Characterization and Measurement-based ModelingA primer that takes on the measurement issues of high-speed interconnects. |
DSA8300 |
DDR Technology Fact SheetTektronix provides a powerful and comprehensive test instrument portfolio for SDRAMs, memory controllers, advanced memory buffers, DIMMs, computer motherboards and embedded systems up to DDR3-1867 speeds and beyond. |
|
SDRAM Memory Systems: Embedded Test & Measurement ChallengesThis DRAM memory primer provides an overview of DRAM concepts, presents potential future DRAM developments and offers an overview for memory design improvement through verification. |
DPO/DSA/MSO70000 |