Serial and Parallel Data Device Characterization and Validation

Signal Generation Solutions

The mixed-signal AWG710B arbitrary waveform generator and DTG5274 data timing generator provide the full range and variety of precise waveforms and digital signals needed to test, validate and characterize even the most challenging designs. They offer up to 32 MB waveform memory configuration and built-in dynamic sequencing, allowing easy generation of complex signals and test patterns for a wide range of emerging bus technologies and high-speed standards. The pairing of the AWG710B and DTG5274 enables full jitter generation with 2 ns amplitude to test the timing and level tolerances of receiver systems in communication designs. Test adapters for DVI and HDMI standards are available as optional accessories.

Analog/Mixed Signal Sources

• Simulate bit streams up to 4.0 Gb/s with 300 fs edge position timing control
• Create the PCI-Express de-emphasis signal with the highest analog bandwidth up to 2.0 GHz
• Simulate two jitter profiles in the same signal
• Create clock jitter required for compliance testing to multiple standards

Logic Signal Sources

• Generate up to 16 differential lanes of serial bit streams up to 3.35 Gb/s with independent level control and 200 fs edge position timing control on each output channel
• Large pattern depth with built-in PRBS patterns up to 223-1 to test Intersymbol Interference effects with different patterns
• Built-in jitter generation capability up to 3.35 Gb/s
• Create the de-emphasis signal used in PCI-Express device characterization and validation
• Variable crossing points and 0.2 ps delay for stressed eye generation on each data output channel
• 3.5 V into 50-Ohm termination for HDMI TMDS differential signaling