Semiconductor Device Characterization and Validation
Signal Generation Solutions
The mixed-signal AWG710 arbitrary waveform generator and DTG5274 data timing generator provide the full range of and variety of precise analog waveforms and digital signals needed to validate device performance and fully characterize devices to their minimum and maximum operating limits. Our expansive range of signal sources offers the designer a limitless workspace to create, import and modify custom signals and waveforms, making them the perfect foundation for semiconductor applications.
- Simultaneous output of analog waveforms and digital signals up to 54 digital bits
- Real-time sequencing provides continuous or branched looping controlled by hardware, software or event triggers
- Replicate composite video signals, digital control lines and analog "read out" of CCD/CMOS sensors
- Easily create jitter profiles and Spread Spectrum Clocks (SSC) using the text (equation) editor to assemble any kind of polynomial to simulate the profile
- Data rates from DC up to 3.35 Gb/s with transition times up to 110 ps (1 Vp-p)
- Multi-channel synchronous output, up to 96 single-ended channels and higher, for data and control lines
- Full and precise control over virtually all digital signal characteristics - 200 fs edge placement/delay control, 5 mV voltage level control, variable crossing point, duty cycle and adjustable slew rate.
- Internal jitter generator up to full data rate with sine, triangle, square and Gaussian profiles with precise control of jitter parameters (amplitude and frequency)
- External clock and external PLL inputs synchronize/track an external reference and generate jitter on all output channels when a jittered/modulated source is applied
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